Title

Synthesis of modular mechatronic products: a testability perspective

Document Type

Article

Peer Reviewed

1

Publication Date

1-1-1999

Journal/Book/Conference Title

IEEE/ASME Transactions on Mechatronics

Volume

4

Abstract

Producing modular products that combine modules with the consideration of product performance, e.g., testability of electronic systems, is frequently stated as a design goal. However, most of mechatronic frameworks (models) discussed in the literature do not consider testability of electronic subsystems of mechatronic products. This paper assumes that the product modules have been established, and aims at the development of modular mechatronic products with the consideration of testability of electronic subsystems as a performance criterion. The generation of modular products and module testability issues are discussed. Testability points, testability values, and access paths for a module/system are crucial to the generation of modular mechatronic products. A generalized label-correcting algorithm is developed to determine the points of focus, testability values, and access paths in modules. This paper contributes to the development of modular mechatronic products with the consideration of testability of electronic subsystems.

Keywords

Sustainability, Producing modular products that combine modules with the consideration of product performance, e.g., testability of electronic systems, is frequently stated as a design goal. However, most of mechatronic frameworks (models) discussed in the literature do not consider testability of electronic subsystems of mechatronic products. This paper assumes that the product modules have been established, and aims at the development of modular mechatronic products with the consideration of testability of electronic subsystems as a performance criterion. The generation of modular products and module testability issues are discussed. Testability points, testability values, and access paths for a module/system are crucial to the generation of modular mechatronic products. A generalized label-correcting algorithm is developed to determine the points of focus, testability values, and access paths in modules. This paper contributes to the development of modular mechatronic products with the consideration of testability of electronic subsystems.

Published Article/Book Citation

IEEE/ASME Transactions on Mechatronics, 4:2 (1999) pp.119-132.



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URL

http://ir.uiowa.edu/cee_pubs/347